T4E – Tuesday 27/9, 16:00-17:30

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16:00 – 17:30 Metrology II (T4E) Room 20

16:00 Detection Sensitivity Of Electrooptic Sampling For Continuous-Wave Terahertz Sources Throughout Broad Frequency Range T4E.1
Yuta Kaneko1; Mayu Kirigaya1; Ikufumi Katayama1; Isao Morohashi2; Yoshihisa Irimajiri2; Shingo Saito2; Norihiko Sekine2; Masaaki Ashida3; Iwao Hosako2
1Yokohama National University, Japan; 2National institute of Information and Communications Technology, Japan; 3Osaka University, Japan
16:15 Estimation Of Spectroscopic Uncertainty And Correlation In Terahertz Time Domain Spectroscopy T4E.2
Nicholas Greenall; Edmund H. Linfield; A. Giles Davies; Lianhe Li; John Cunningham; Andrew Burnett
University of Leeds, United Kingdom
16:30 An International Intercomparison Of THz Time-domain Spectrometers (Keynote Talk) T4E.3
Mira Naftaly
National Physical Laboratory UK, United Kingdom
17:00 Stress Measurements In YTZP Ceramic Using GHz And THz Radiation T4E.4
Gilles Diederich; Peter Schemmel; Andrew J Moore
Heriot-Watt University, United Kingdom
17:15 THz-Metrology Of Time-Domain-Spectroscopy Systems T4E.5
Andreas Steiger1; Karsten Lange2; Mathias Kehrt1
1PTB, Germany; 2SLT Sensor- und Lasertechnik GmbH, Germany